• Multi-functional X-ray Diffractometer

Multi-functional X-ray Diffractometer

Application range:
Multi-functional X-ray Diffractometer

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Multi-functional X-ray Diffractometer

AL-2700 series diffractometer is designed for material research and industrial product analysis, and it is a perfect product which combines the conventional analysis and special purpose measurement.

●The perfect combining with hardware and software system, satisfy with the requirement of different application field academician, scientific research.

●High precision diffraction angle measuring system, obtaining more accurate measurement results.

●High stability X-ray generator control system, and get more stable repeatable measurement precision.

● Various functional accessories meet the requirement of different testing purposes.

●Program operation, integrated structure design, easy to operate, more beautiful appearance of the instrument.

X-ray diffractometer is a kind of universal testing instrument for revealing crystal structure and chemical information of material:

●One and many phase identification of unknown sample

●Quantitative analysis of the phase in the mixed sample

●Crystal structure analysis ( Rietveld structure analysis)

●The crystal structure change (high temperature and low temperature condition) of the abnormal condition.

●Thin film sample analysis, including film, multilayer film thickness, surface roughness, charge density.

●Analysis of micro area sample.

●Texture and stress analysis of metallic materials




Rated power

3kW(HF, HV control technology)


Tube voltage


Tube current



X-ray tube

Metal ceramic tube   Target material: CuFeCoCrMo, etc   


Focus size

1×10mm or 0.4×14mm or 2×12mm




Goniometer structure

        Sample level(θ~θ)

Radius of diffraction

225mm(or custom by request:150~285mmrange)

2θ Scanning range


Scanning speed


Angle locating speed


Scanning fashion

θs/ θd  linkage /single acting; continuous, stepping and Omg

Minimal stepping angle


Angle repeatable accuracy


2θ Angular linearity

International standard sample(Si, Al203), the angle of all peak in full spectrum are not more than ±0.02°


Proportional counters(PC)or scintillation counter(SC), Silicon drift 

detector(SDD),  High speed one-dimensional semiconductor array 


Maximal counting rate of linearity

5×105CPS(PC、SC with the compensate function of miss counting)、

             15×104CPS (SDD)、 9×107CPS(one-dimensional array)

Energy resolution ratio

≤25%(PC、one-dimensional array)、≤50%(SC)、≤200eV(SDD)

Counting fashion

differential coefficient or integral, PHA automatically, dead time regulate

Stability of system measure


Scattered rays dose

1μSv/h(without X-ray protective device)

Instrument integrative stability



Figure size


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