Built-in X-ray Crystal Orientation Instrument

Features

It is a new type of double workbench crystal orientation instrument, developed by our company according to the needs of the customer's production process. Mainly used in silicon single crystal sapphire and other crystal angle measurement. One side of the sample table uses V groove design, can measure the angle of the end face of a crystal bar with a diameter of 2~8 inches of 500mm. Other side of the table can measure the angle of the OF surface of the crystal bar. It can also measure the angle of the 2~8 inch wafer end face, and the measurable weight is 1~50 Kg. Humanization design makes the machine more easy to operate.

Technical Parameters

• Input power: Single phase, AC 220V, 50Hz, 0.5kW

• X-ray tube: Cu target, air cooling. Tube voltage: 30kV. Tube current: 0~5mA

• Counter: Geiger counter

• Time constant: 0.1s, 0.4s, 3s

• Testing Range of Angel: θ= -5°x~-55°， 2θ= -10°~-110°

• Digital display: Degree, Minute, Second

• Minimum reading: 1’’

• Angle adjustment: Number can be displayed at any angle

• Slit range: 4', 5', 6'

• Optical Shuttle: Manual

• Display: Digital angle display

• Composite precision: ±30"

• Size: 1160mm(L)X 700mm(W)X 1380mm(H)

• Weight: 170kg