
Built-in X-ray Crystal Orientation Instrument
description
Built-in X-ray Crystal Orientation Instrument
Features
It is a new type of double workbench crystal orientation instrument, developed by our company according to the needs of the customer's production process. Mainly used in silicon single crystal sapphire and other crystal angle measurement. One side of the sample table uses V groove design, can measure the angle of the end face of a crystal bar with a diameter of 2~8 inches of 500mm. Other side of the table can measure the angle of the OF surface of the crystal bar. It can also measure the angle of the 2~8 inch wafer end face, and the measurable weight is 1~50 Kg. Humanization design makes the machine more easy to operate.
Technical Parameters
Input power: Single phase, AC 220V, 50Hz, 0.5kW
X-ray tube: Cu target, air cooling. Tube voltage: 30kV. Tube current: 0~5mA
Counter: Geiger counter
Time constant: 0.1s, 0.4s, 3s
Testing Range of Angel: θ= -5°x~-55°, 2θ= -10°~-110°
Digital display: Degree, Minute, Second
Minimum reading: 1’’
Angle adjustment: Number can be displayed at any angle
Slit range: 4', 5', 6'
Optical Shuttle: Manual
Display: Digital angle display
Composite precision: ±30"
Size: 1160mm(L)X 700mm(W)X 1380mm(H)
Weight: 170kg